Analytical electron microscopy for photonics II

Chair: Jonas Lähnemann (Paul-Drude-Institut für Festkörperelektronik)

Co-Chair: Kagiso Loeto (Paul-Drude-Institut für Festkörperelektronik)

Electron beam techniques have emerged as powerful tools for characterising and fabricating a myriad of materials systems at length scales ranging from the micrometres to nanometres. More recently also pulsed electron beams have been used to obtain temporal resolution.

This makes such techniques exciting for next-generation semiconductor and photonics research. Through the use of high-energy electron beams in either scanning or transmission microscopicmodes, the spectroscopic, chemical, structural, and topographical properties of such systems can be investigated using techniques such as cathodoluminescence spectroscopy (CL), scanning transmission electron microscopy (STEM), electron energy loss spectroscopy (EELS), electron tomography (ET), energy dispersive X-ray spectroscopy (EDS), and electron backscatter diffraction (EBSD).

This session will bring together electron beam technique experts to present their latest applications, discuss scientific results and evaluate recent developments inmeasurement systems. Furthermore, it will provide the broader photonics community to get an idea what they could learn using these microscopy techniques.

During the tour to Paul-Drude-Institut (PDI) on Friday, there will be the chance to visit the new world-class “Application Laboratory Time-resolved Cathodoluminescence Spectroscopy(ZALKAL)”. This lab is also open to collaborations with and service measurements for academic and industrial partners.